Links：http://www.myblossom.tw/hot_289821.html
自華® 玻璃晶圓微塵檢測機台 | Glass Wafer Particle Inspection System
自華光電的ParticleInspect專爲原片玻璃晶圓和抗反射鍍膜玻璃晶圓的高速微塵/顆粒物檢測而設計。
對於粉塵，毛髮，纖維或黏附的玻璃碎片等最小微粒的高分辨率掃描，將確保在發生大規模生産損失之前，識别和處理污染源。
玻璃晶圓的ParticleInspect可以清晰地區分A側和B側的微粒，這是ParticleInspect檢測獨有的優點。該系統包括同位進出的完整獨立的自動光學解决方案。
自華光電 - 德國 信科博士股份有限公司(Schenk) 玻璃晶圓微塵檢測機台(Glass Wafer Particle Inspection System) 台灣代理商。
Allen K. Lin | Allen@myblossom.tw | LINE ID: Allen-007 | Wechat ID: Allen-006
myBlossom® Glass Wafer Particle Inspection System | ParticleInspect
ParticleInspect for glass wafer particle inspection is designed for high-speed particle detection of bare glass wafers and glass wafers with AR coating.
PartcileInspect provides high resolution scanning for smallest particles, such as dust, hair, fibers, adhered glass chips. This helps ensures that sources of contamination can be identified and addressed before large production loses occur.
ParticleInspect for bare glass wafer inspection can differentiate clearly between A-side and B-side particles, an exclusive benefit of the Dr. Schenk inspection. The system comprises a complete stand alone AOI solution with drawer handling.
ParticleInspect for glass wafer particle inspection is designed for high-speed particle detection of bare glass wafers and glass wafers with AR coating.
PartcileInspect provides high resolution scanning for smallest particles, such as dust, hair, fibers, adhered glass chips. This helps ensures that sources of contamination can be identified and addressed before large production loses occur.
ParticleInspect for bare glass wafer inspection can differentiate clearly between A-side and B-side particles, an exclusive benefit of the Dr. Schenk inspection. The system comprises a complete stand alone AOI solution with drawer handling.
